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Robust FinFET SRAM design based on dynamic back-gate voltage adjustment.

Behzad EbrahimiAli Afzali-KushaHamid Mahmoodi
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • case study
  • computationally efficient
  • dynamic environments
  • building blocks
  • design process
  • power system
  • computer aided
  • design tools