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The Resistance Analysis Attack and Security Enhancement of the IMC LUT Based on the Complementary Resistive Switch Cells.
Xiaole Cui
Mingqi Yin
Hanqing Liu
Xiaoxin Cui
Published in:
ACM Trans. Design Autom. Electr. Syst. (2024)
Keyphrases
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image processing
image analysis
intrusion detection
information security
information systems
data analysis
gray scale
forensic analysis
security measures