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Impact of fin thickness and height on read stability / write ability in tri-gate FinFET based SRAM.
Junha Lee
Hanwool Jeong
Younghwi Yang
Jisu Kim
Seong-Ook Jung
Published in:
ISOCC (2012)
Keyphrases
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stability analysis
read write
power consumption
data transmission
database
data structure
low cost
key features
nano scale
leakage current