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Impact of fin thickness and height on read stability / write ability in tri-gate FinFET based SRAM.

Junha LeeHanwool JeongYounghwi YangJisu KimSeong-Ook Jung
Published in: ISOCC (2012)
Keyphrases
  • stability analysis
  • read write
  • power consumption
  • data transmission
  • database
  • data structure
  • low cost
  • key features
  • nano scale
  • leakage current