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Modeling and Simulations of Beam Stabilization in Edge-Emitting Broad Area Semiconductor Devices.

Mindaugas RadziunasRaimondas Ciegis
Published in: PPAM (2) (2013)
Keyphrases
  • semiconductor devices
  • electron beam
  • agent based modeling
  • edge information
  • edge detection
  • x ray
  • numerical simulations
  • physical models
  • field effect transistors