On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs.

Mottaqiallah Taouil Said Hamdioui Jouke Verbree Erik Jan Marinissen

Published in: ITC (2010)

Keyphrases

semiconductor manufacturing
integrated circuit
massively parallel
neural network
information retrieval
decision trees
computational complexity
fine grained
real time
machine learning
decision making
feature extraction
data streams
information technology
multiresolution
markov random field