Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors.
Kang LiuBenjamin TanRamesh KarriSiddharth GargPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
- training data
- maximum likelihood
- description logics
- data sets
- computer aided
- test data
- supervised learning
- object detection
- learning algorithm
- decision trees
- training set
- electron beam
- computer aided design
- object oriented
- training examples
- expressive power
- classification accuracy
- prior knowledge
- test set
- training process
- training samples
- design process
- knowledge base
- labeled data
- training instances
- early warning
- noisy data
- classification models
- support vector machine
- feature detectors
- class labels
- unlabeled data
- semantic web