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Using SiGe-on-SOI HBTs to Build 300°C Capable Analog Circuits.

Anup P. OmprakashAdrian IldefonsoGeorge N. TzintzarovJeffrey BabcockRajarshi MukhopadhyayJohn D. Cressler
Published in: BCICTS (2018)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • wavelet packet transform
  • neural network
  • real time
  • decision making
  • image processing
  • search space
  • pattern matching
  • model based diagnosis
  • dual channel