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S Monitoring: Microstructural and Optoelectronic Characterization.

Vikas PatilDatta JundaleShailesh PawarManik ChougulePrsad GodseSanjay PatilBharat RautShashwati Sen
Published in: J. Sens. Technol. (2011)
Keyphrases
  • monitoring system
  • real time
  • data sets
  • machine learning
  • decision support
  • white matter
  • similarity measure
  • data structure
  • condition monitoring
  • tool wear