LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects.
Krishna SekarSujit DeyPublished in: J. Electron. Test. (2003)
Keyphrases
- built in self test
- low cost
- low power
- integrated circuit
- hardware and software
- embedded systems
- lower cost
- input output
- logic programming
- real time
- detection scheme
- hardware software co design
- predicate logic
- cmos technology
- asynchronous circuits
- classification scheme
- lateral inhibition
- power dissipation
- data acquisition
- test cases
- image quality
- general purpose