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All-Optical Performance Characterization of Silicon Mach-Zehnder Modulator for Wafer-Level Test.

Hiroshi FukudaYoshiho MaedaToru MiuraShinji Matsuo
Published in: OECC/PSC (2019)
Keyphrases
  • liquid crystal
  • low cost
  • neural network
  • control system
  • test cases
  • statistical tests
  • levels of abstraction
  • ccd camera
  • delta sigma