SMD LED chips defect detection using a YOLOv3-dense model.

Ssu-Han Chen Chia-Chun Tsai

Published in: Adv. Eng. Informatics (2021)

Keyphrases

mathematical model
statistical model
computational model
conceptual model
simulation model
formal model
defect detection
probabilistic model
information retrieval
genetic algorithm
decision trees
image segmentation
similarity measure
artificial neural networks
experimental data