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Combining fault tolerance and serialization effort to improve yield in 3D Networks-on-Chip.

Anelise KologeskiCaroline ConcattoDebora MatosDaniel GrehsTiago MottaFelipe AlmeidaFernanda Lima KastensmidtAltamiro Amadeu SusinRicardo Reis
Published in: ICECS (2013)
Keyphrases