Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan.

Guangyong Li Yucai Wang Lianqing Liu

Published in: IEEE Trans Autom. Sci. Eng. (2012)

Keyphrases

atomic force microscopy
case study
scan data
concept drift
capacity planning
decision making
competitive environment
information technology
short and long term
database
databases
supply chain
knowledge management
strategic planning
information warfare