Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.
Somayeh Sadeghi KohanSybille HellebrandPublished in: VTS (2020)
Keyphrases
- cost function
- pairwise
- computational cost
- high accuracy
- fully automatic
- computationally efficient
- significant improvement
- high precision
- detection method
- computational complexity
- preprocessing
- experimental evaluation
- segmentation algorithm
- low frequency
- learning algorithm
- test data
- clustering method
- mutual information
- similarity measure