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Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs.
Mukesh Agrawal
Krishnendu Chakrabarty
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
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data sets
real world
multiscale
testing process
information systems
case study
statistically significant
test data
high cost