A precise inspection technique for wafer pre-sawing lines using Affine transformation.
Hyung Tae KimKang Won LeeSung-Chul KimHae-Jeong YangPublished in: Int. J. Comput. Appl. Technol. (2010)
Keyphrases
- affine transformation
- affine invariant
- feature points
- image registration
- similarity transformations
- image matching
- b spline
- transformation model
- moment invariants
- affine structure
- geometric transformations
- control points
- image deformations
- hough transform
- integrated circuit
- line segments
- transformed images
- visual inspection
- multiscale
- affine transform
- curve matching