Selecting feature lines in generalized dissimilarity representations for pattern recognition.
Yenisel Plasencia CalanaMauricio Orozco-AlzateEdel B. García ReyesRobert P. W. DuinPublished in: Digit. Signal Process. (2013)
Keyphrases
- pattern recognition
- dissimilarity representation
- image processing
- computer vision
- selection algorithm
- signal processing
- dimensionality reduction
- data sets
- machine learning
- feature vectors
- structural pattern recognition
- hough transform
- neural network
- vector representation
- pattern recognition problems
- dissimilarity measure
- line segments
- image features
- pattern classification
- graph matching
- image segmentation
- feature space
- selecting features
- image analysis
- high dimensional