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Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review.
Sajal K. Das
Faisal R. Badal
Md. Atikur Rahman
Md. Atikul Islam
Subrata K. Sarkar
Norottom Paul
Published in:
IEEE Access (2019)
Keyphrases
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high speed
significant improvement
preprocessing
neural network
website
statistical methods
real time
single image
gray scale
benchmark datasets
machine learning methods
structured light
atomic force microscopy