Concurrent error detection for finite state machines implemented with embedded memory blocks of SRAM-based FPGAs.
Andrzej KrasniewskiPublished in: Microprocess. Microsystems (2008)
Keyphrases
- finite state machines
- error detection
- error correction
- finite state automata
- dynamic random access memory
- embedded systems
- error recovery
- error correcting
- fault tolerance
- model checking
- hidden markov models
- fault isolation
- smart camera
- data cleansing
- random access memory
- database
- response time
- data transmission
- regular expressions
- field programmable gate array
- fault tolerant
- power consumption
- pattern matching
- image quality