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A Low-Cost Output Response Analyzer for the Built-in-Self-Test S-? Modulator Based on the Controlled Sine Wave Fitting Method.
Shao-Feng Hung
Hao-Chiao Hong
Sheng-Chuan Liang
Published in:
Asian Test Symposium (2009)
Keyphrases
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fitting method
low cost
data acquisition
built in self test
model fitting
image processing
computer vision
training data
pairwise
active appearance models