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Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.
Tomoaki Konishi
Hiroyuki Yotsuyanagi
Masaki Hashizume
Published in:
3DIC (2011)
Keyphrases
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management system
real time
data sets
input output
database
database systems
test data
data flow
distributed processing