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Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.

Tomoaki KonishiHiroyuki YotsuyanagiMasaki Hashizume
Published in: 3DIC (2011)
Keyphrases
  • management system
  • real time
  • data sets
  • input output
  • database
  • database systems
  • test data
  • data flow
  • distributed processing