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On the design of optimal counter-based schemes for test set embedding.

Dimitrios KagarisSpyros Tragoudas
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
  • test set
  • optimal design
  • error rate
  • training set
  • test data
  • evaluation methodology
  • training data
  • optimal solution
  • object recognition
  • class distribution
  • feature selection
  • decision trees
  • computer aided