Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits.
Oriol RoigJordi CortadellaMarco A. PeñaEnric PastorPublished in: DAC (1997)
Keyphrases
- asynchronous circuits
- delay insensitive
- pattern discovery
- process algebra
- pattern mining
- database
- automatically generate
- learning algorithm
- data mining techniques
- pattern analysis
- asynchronous communication
- information retrieval
- low cost
- distributed systems
- model checking
- decision trees
- statistical tests
- complex patterns
- similar patterns
- artificial intelligence