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Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers.

Andrea PadovaniMilan PesicMondol Anik KumarPieter BlommeAlexandre SubiratsSenthil VadakupudhupalayamZunaid BatenLuca Larcher
Published in: IRPS (2019)
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