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A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding.

Haiying YuanKun GuoXun SunZijian Ju
Published in: J. Electron. Test. (2016)
Keyphrases
  • test data
  • test set
  • data sets
  • training data
  • similarity measure
  • test cases
  • cross validation
  • computational complexity
  • feature vectors
  • facial expressions
  • high order