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Silicon compilation of hierarchical control sections with unified BIST testability.

Michael NicolaidisKholdoun TorkiAhmed Amine JerrayaBernard Courtois
Published in: Microprocess. Microsystems (1991)
Keyphrases
  • control system
  • low cost
  • optimal control
  • multiscale
  • high speed
  • closed loop
  • high density
  • process control
  • robot control