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Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield Enhancement.
Shengcheng Wang
Krishnendu Chakrabarty
Mehdi Baradaran Tahoori
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
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clustering method
k means
clustering algorithm
image enhancement
self organizing maps
resource allocation
hierarchical clustering
image processing
cluster analysis
defect detection
data mining
search engine
data points
data clustering
graph theoretic
allocation problems