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On the microwave photonics based pulsed-time-of-flight techniques in the measurement of the thickness of dielectric sheets.
Janne P. Aikio
Juha Kostamovaara
Markus Berg
Erkki T. Salonen
Published in:
I2MTC (2017)
Keyphrases
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time of flight
infrared
depth information
dielectric constant
depth images
depth map
high accuracy
tof camera
high resolution
waveguide
range data
depth data
stereo vision
depth video
spatial resolution
low resolution
image data