Login / Signup

Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs.

G. SereniLuca VandelliRoberto CavicchioliLuca LarcherDmitry VekslerGennadi Bersuker
Published in: IRPS (2015)
Keyphrases
  • density distribution
  • heat flow
  • density function
  • high efficiency
  • machine learning
  • image sequences
  • pairwise
  • high dimensional
  • multi dimensional