A tomographic workflow to enable deep learning for X-ray based foreign object detection.
Mathé T. ZeegersTristan van LeeuwenDaniël Maria PeltSophia Bethany CobanRobert van LiereKees Joost BatenburgPublished in: Expert Syst. Appl. (2022)
Keyphrases
- x ray
- deep learning
- object detection
- electron microscopy
- electron microscope
- unsupervised learning
- x ray images
- weakly supervised
- digital x ray images
- mental models
- object class
- intraoperative
- filtered back projection
- object categories
- tomographic images
- machine learning
- object recognition
- three dimensional
- computer vision
- object segmentation
- multi class
- projection images
- data mining
- dimensionality reduction
- domain specific
- probabilistic model
- cone beam
- metal oxide