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Test vector decomposition-based static compaction algorithms for combinational circuits.
Aiman H. El-Maleh
Yahya E. Osais
Published in:
ACM Trans. Design Autom. Electr. Syst. (2003)
Keyphrases
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learning algorithm
optimization problems
computationally efficient
data structure
computational cost
theoretical analysis
orders of magnitude
post hoc
machine learning
evolutionary algorithm
classification algorithm
statistical tests
asynchronous circuits