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An 11-bit 100-MS/s Pipelined-SAR ADC Reusing PVT-Stabilized Dynamic Comparator in 65-nm CMOS.

Jin ZhangXiaoqian RenShubin LiuChi-Hang ChanZhangming Zhu
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2020)
Keyphrases
  • analog to digital converter
  • power consumption
  • random access memory
  • low cost
  • dynamic environments
  • high speed
  • low power
  • data flow
  • clock gating
  • wavelet transform
  • cmos technology