Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects.
Shi-Yu HuangMeng-Ting TsaiHua-Xuan LiZeng-Fu ZengKun-Han Hans TsaiWu-Tung ChengPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)