Novel Framework for Optical Film Defect Detection and Classification.
Ngoc Tuyen LeJing-Wein WangMeng-Hsiang ShihChou-Chen WangPublished in: IEEE Access (2020)
Keyphrases
- defect detection
- main contribution
- pattern recognition
- classification accuracy
- support vector machine
- class labels
- classification process
- pattern classification
- machine learning algorithms
- multiple kernel learning
- classification rate
- classification models
- conceptual framework
- bayesian framework
- classification rules
- theoretical framework
- data sets
- unsupervised learning
- supervised learning
- support vector
- feature extraction
- three dimensional
- neural network