Login / Signup

Switch Open-Circuit Fault Localization Strategy for MMCs Using Sliding-Time Window Based Features Extraction Algorithm.

Fujin DengMing JinChengkai LiuMarco LiserreWu Chen
Published in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
  • features extraction
  • matching algorithm
  • database
  • decision trees
  • similarity measure
  • high quality
  • input image
  • rough sets
  • fault detection
  • fault localization