Testing a Transistor-Level Programmable Fabric: Challenges and Solutions.

Apurva Jain Thomas Broadfoot Carl Sechen Yiorgos Makris

Published in: VTS (2024)

Keyphrases

lessons learned
low cost
data sets
high speed
genetic algorithm
optimal solution
higher level
test set
levels of abstraction
computational issues
web services
low level
general purpose
neural network
databases
tabu search
database
integrated circuit
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practical solutions