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Linking the Verification and Validation of Complex Integrated Circuits Through Shared Coverage Metrics.
Eddie Hung
Bradley R. Quinton
Steven J. E. Wilton
Published in:
IEEE Des. Test (2013)
Keyphrases
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integrated circuit
complex systems
database
neural network
real world
high level
model checking
complex data
printed circuit boards
information retrieval
artificial intelligence
website
web services