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Linking the Verification and Validation of Complex Integrated Circuits Through Shared Coverage Metrics.

Eddie HungBradley R. QuintonSteven J. E. Wilton
Published in: IEEE Des. Test (2013)
Keyphrases
  • integrated circuit
  • complex systems
  • database
  • neural network
  • real world
  • high level
  • model checking
  • complex data
  • printed circuit boards
  • information retrieval
  • artificial intelligence
  • website
  • web services