Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry.
Georgios KoutroulisTiago SantosMichael WiedemannChristian FaistauerRoman KernStefan ThalmannPublished in: KDIR (2020)
Keyphrases
- convolutional neural networks
- defect classification
- active learning
- case study
- convolutional network
- supervised learning
- selective sampling
- semi supervised
- learning strategies
- world wide
- semiconductor manufacturing
- test bed
- music emotion classification
- imbalanced data classification
- pool based active learning
- relevance feedback
- training set
- learning algorithm
- machine learning
- batch mode
- leading edge
- random sampling
- neural network
- semi supervised learning
- face recognition