Login / Signup
Design for concurrent error detection and testability in storage/logic arrays.
Howard V. Savin
Mary S. Bucknell
Marc D. Spaulding
Thomas B. Maciukenas
W. Kent Fuchs
Published in:
IEEE J. Solid State Circuits (1994)
Keyphrases
</>
error detection
error correction
digital circuits
data cleansing
artificial intelligence
multi agent
data warehouse
wireless networks