Silicon substrate strength enhancement depending on nanostructure morphology.

Kunal Kashyap Amarendra Kumar Chung-Yao Yang Max T. Hou J. Andrew Yeh

Published in: NEMS (2014)

Keyphrases

semiconductor devices
image processing
image enhancement
image analysis
high density
low cost
mathematical morphology
magnetic recording
liquid crystal
high speed
transmission electron microscopy
databases
morphological analysis
contrast enhancement
structuring elements
image sequences
information retrieval