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Structural and electrical characterization of thermally oxidized Zn films.

Oscar García-SerranoMarco Vazquez-AgustinRamon Peña-SierraGabriel Romero-ParedesO. Goiz-Amaro
Published in: CCE (2010)
Keyphrases
  • electrical properties
  • structural information
  • short circuit
  • infrared
  • grain size
  • structural features
  • discrete space
  • machine learning
  • artificial intelligence
  • thin film
  • structural analysis
  • structural model