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Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors.
J. K. Mee
R. A. B. Devine
L. Trombetta
R. J. Kaplar
P. Gouker
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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field effect transistors
schottky barrier
steady state
high density
electric field
mathematical analysis
surface temperature
power system
anomaly detection
data sets
room temperature
low variance
wide range
neural network
measurement error
detecting anomalous
databases