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Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST.

Jongho ParkSangjun LeeInhwan LeeSungwhan ParkSungho Kang
Published in: ISOCC (2022)
Keyphrases
  • pattern generation
  • built in self test
  • power reduction
  • integrated circuit
  • power consumption
  • low power
  • swarm robots
  • cellular automaton
  • real time
  • pattern recognition
  • query processing
  • pattern matching