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Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST.
Jongho Park
Sangjun Lee
Inhwan Lee
Sungwhan Park
Sungho Kang
Published in:
ISOCC (2022)
Keyphrases
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pattern generation
built in self test
power reduction
integrated circuit
power consumption
low power
swarm robots
cellular automaton
real time
pattern recognition
query processing
pattern matching