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Photon emission microscopy of inter/intra chip device performance variations.
Stas Polonsky
M. Bhushan
A. Gattiker
Alan J. Weger
Peilin Song
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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high speed
image analysis
low cost
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monte carlo
high density
analog vlsi
physical design
host computer
electron microscopy
programmable logic
neural network
image processing
vlsi implementation
evolvable hardware
fluorescence microscopy