An EMI Resisting LIN Driver in 0.35-micron High-Voltage CMOS.
Jean-Michel RedouteMichiel SteyaertPublished in: IEEE J. Solid State Circuits (2007)
Keyphrases
- high voltage
- cmos technology
- low power
- high speed
- operating conditions
- power consumption
- learning bayesian networks
- special case
- low cost
- partial discharge
- power supply
- normal operation
- situation calculus
- circuit design
- electron beam
- parallel processing
- analog vlsi
- data sets
- traffic accidents
- fault diagnosis
- fuzzy logic
- delay insensitive
- control strategy
- decision support system
- focal plane
- data streams
- bayesian networks
- decision trees