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Efficient Algorithms for Testing Semiconductor Random-Access Memories.

Ravindra NairSatish M. ThatteJacob A. Abraham
Published in: IEEE Trans. Computers (1978)
Keyphrases
  • random access
  • solid state
  • disk storage
  • memory size
  • flash memory
  • multiview video coding
  • test cases
  • data structure
  • relational databases
  • response time
  • motion vectors
  • associative memory