Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry.
Yang ShangMakoto ShinoharaEiji KatoMasaichi HashimotoJoanna KiljanPublished in: ITC (2021)
Keyphrases
- normalization method
- high resolution
- low resolution
- frequency domain
- high frequency
- image processing
- field of view
- remote sensing
- super resolution
- high quality
- databases
- low resolution images
- magnetic resonance images
- website
- genetic algorithm
- database
- facial expressions
- image analysis
- fourier transform
- pattern recognition
- satellite images
- image recognition
- high resolution images
- defect detection
- automated visual inspection
- sonar images