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Repairing Order-Dependent Flaky Tests via Test Generation.

Chengpeng LiChenguang ZhuWenxi WangAugust Shi
Published in: ICSE (2022)
Keyphrases
  • test generation
  • test cases
  • artificial intelligence
  • high quality
  • real world
  • machine learning
  • computer vision
  • information systems
  • information technology
  • data flow