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All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.

Michael SekyereMarampally SaikiranDegang Chen
Published in: IOLTS (2022)
Keyphrases
  • low cost
  • test suite
  • low power
  • database
  • data sets
  • learning algorithm
  • three dimensional
  • wide range
  • learning environment
  • multiscale
  • high speed
  • software testing
  • test generation
  • code coverage