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All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.
Michael Sekyere
Marampally Saikiran
Degang Chen
Published in:
IOLTS (2022)
Keyphrases
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low cost
test suite
low power
database
data sets
learning algorithm
three dimensional
wide range
learning environment
multiscale
high speed
software testing
test generation
code coverage