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A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples.

He ZhaoJinhai LiuJianhua TangXiangkai ShenSenxiang LuQiannan Wang
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • support vector machine svm
  • defect detection
  • data sets
  • pairwise
  • similarity measure
  • support vector machine
  • text mining
  • training samples
  • clustering method
  • test data